Shift Left Complicates Fab Data Management

What happened

Shift Left Complicates Fab Data Management, according to Semiconductor Engineering. Streaming sensor data creates new challenges for advanced process control. The post Shift Left Complicates Fab Data Management appeared first on Semiconductor Engineering .

Key Takeaways: “Shift left” improves yield by moving detection earlier. Fabs are using real-time equipment sensor data and AI/ML to identify process excursions inside the process module and improve advanced process control.

Higher sampling rates, hundreds of sensor parameters, and sub-second analysis are increasing the volume, velocity, and variety of manufacturing data. Semiconductor fabs are leveraging AI/ML models and raw equipment data to speed up yield learning, but the volume of data they are collecting — in some cases, hundreds of petabytes a year — is forcing some tough decisions about optimization versus context.